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Electron microscope
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611	Super Resolution Confocal Microscopy Suite Today, 23rd September 2014, Minister Paul Kehoe TD, Government Chief Whip & Minister of State at the Departments of the Taoiseach & Defence, formally opened the Super Resolution Add to Reading List Source URL: www.tcd.ie Language: English - Date: 2014-09-24 06:09:00 Microscopy Electron microscopy Confocal microscopy CRANN Microscopes Leica Microsystems Electron microscope Nanotechnology Scientific method Science Microbiology
612	Supplementary Material for “Characterization and reduction of microfabrication-induced decoherence in superconducting quantum circuits” C. M. Quintana,1 A. Megrant,1 Z. Chen,1 A. Dunsworth,1 B. Chiaro,1 R. Barends,1 Add to Reading List Source URL: web.physics.ucsb.edu Language: English - Date: 2014-08-14 14:18:10 Semiconductor device fabrication Science Thin film deposition Physics Electromagnetism Electron beam lithography Focused ion beam Resonator Electron microscope Materials science Microtechnology Electron microscopy
613	Nuclear Safeguards and non-Proliferation Environmental Sampling Analysis A key topic in international Safeguards is the work in preventing further spread of nuclear weapon technology and nuclear materials that can be use Add to Reading List Source URL: ec.europa.eu Language: English - Date: 2013-04-16 09:09:43 Mass spectrometry Electron microscopy Spectroscopy Measuring instruments Atomic physics Secondary ion mass spectrometry Cameca Institute for Transuranium Elements Scanning electron microscope Scientific method Science Chemistry
614	Scanning electron microscope (SEM) Application:  Appraisal of polymers, stone, glass et cetera Add to Reading List Source URL: www.isc.fraunhofer.de Language: English - Date: 2014-03-14 10:01:39 Chemistry Scanning electron microscope Electron microscope Glass Sodium Vacuum Water vapor Electron Physics Scientific method Electron microscopy
615	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-19 10:56:18 Semiconductor device fabrication Electron microscopy Materials science Failure Failure analysis Reliability engineering Reliability Electron microscope Microelectromechanical systems Science Technology Electromagnetism
616	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:27:23 Nanoparticle Electron microscope Environmental scanning electron microscope Nanotechnology Electron microscopy Science Scanning electron microscope
617	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-19 10:54:40 Electron microscopy Failure Failure analysis Maintenance Problem solving Reliability engineering Wafer bonding Electron microscope Microscopy Scientific method Science Chemistry
618	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:28:18 Electron microscopy Mass spectrometry Molecular electronics Conductive polymers Electron microscope Scanning electron microscope OLED Characterization Inductively coupled plasma mass spectrometry Scientific method Science Chemistry
619	PDF Document Add to Reading List Source URL: www.gitverlag.com Language: English - Date: 2014-11-05 08:25:43 Scientific method Optical microscope Scanning probe microscopy Microscope Royal Microscopical Society Electron microscope Image resolution Super resolution microscopy Microscopy Microbiology Science
620 $Semiconductor device fabrication / Thin film deposition / Electron beam / Focused ion beam / Failure analysis / Electron beam induced current / Electron microscope / Scanning electron microscope / Electron backscatter diffraction / Scientific method / Science / Electron microscopy$	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:29:23 Semiconductor device fabrication Thin film deposition Electron beam Focused ion beam Failure analysis Electron beam induced current Electron microscope Scanning electron microscope Electron backscatter diffraction Scientific method Science Electron microscopy

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